| Allowed Value | Details |
|---|---|
| CLASSIFICATION | |
| CRYSTALLOGRAPHY MERGING | |
| CTF CORRECTION | |
| DIFFRACTION INDEXING | |
| FINAL EULER ASSIGNMENT | |
| IMAGE ACQUISITION | |
| INITIAL EULER ASSIGNMENT | |
| LATTICE DISTORTION CORRECTION | |
| LAYERLINE INDEXING | |
| MASKING | |
| MODEL FITTING | |
| MODEL REFINEMENT | |
| MOLECULAR REPLACEMENT | |
| OTHER | |
| PARTICLE SELECTION | |
| RECONSTRUCTION | |
| SERIES ALIGNMENT | |
| SYMMETRY DETERMINATION | |
| VOLUME SELECTION |
| Allowed Value | Details |
|---|---|
| CLASSIFICATION | |
| CRYSTALLOGRAPHY MERGING | |
| CTF CORRECTION | |
| DIFFRACTION INDEXING | |
| FINAL EULER ASSIGNMENT | |
| IMAGE ACQUISITION | |
| INITIAL EULER ASSIGNMENT | |
| LATTICE DISTORTION CORRECTION | |
| LAYERLINE INDEXING | |
| MASKING | |
| MODEL FITTING | |
| MODEL REFINEMENT | |
| MOLECULAR REPLACEMENT | |
| OTHER | |
| PARTICLE SELECTION | |
| RECONSTRUCTION | |
| SERIES ALIGNMENT | |
| SYMMETRY DETERMINATION | |
| VOLUME SELECTION |